Resumo

REIS, ANDRÉA CANDIDO DOS; VALENTE, MARIANA LIMA DA COSTA  e  SHIMANO, ANTONIO CARLOS. Characterization of microstructural dental implants subject to pull test. RPG, Rev. pós-grad. [online]. 2012, vol.19, n.1, pp. 1-08. ISSN 0104-5695.

The aim of our study was to characterize the surface of implants subjected to tensile test in synthetic bone using scanning electron microscopy (SEM) and energy dispersive spectrometry X ray (EDS). To characterize the implants it was used Scanning Electron Microscope (SEM) coupled to an EDS, and for the tensile testing Machine Universal Testing. Femurs were used as synthetic bone specimens and were placed in four types of implants in the following sequence: cylindrical machined surface implants (ICSU), cylindrical implants with double surface treatment Porous (ICDTSP), cylindrical implants with surface treatment Porous (ICTSP) Tapered Implants with Porous surface treatment (ICOTSP), totalizing 8 bone samples and 32 implants. Before insertion and after the tensile test, the screws were analyzed by SEM and EDS (Zeiss, Model: EVO50), under magnification of 35 x. The results were tested using the multifactorial analysis of variance (ANOVA) followed by Tukey test (5% significance for the tests). Only ICOTSP implants 3.5 mm in diameter and 3.75 mm for implants ICDTSP showed significant difference as the forces of deformation (FD) and tearing (FA) (Tukey: FD - p = 0.014; FA - p = 0.009). The images obtained with the SEM revealed no visible surface charts and EDS showed no significant differences in concentration of chemical elements in samples. Surface characterization and chemistry of the implants showed no significant changes in their topography and composition when analyzed by SEM and EDS.

Palavras-chave : Dental Implants; Osseointegration; Traction; Microscopy, electron, scanning; Topography.