Resumo

BONACHELA, Wellington Cardoso. Evaluation of compromised dental implant by using scanning electron microscopy and energy-dispersive spectrometer X-ray. Innov. Implant. J., Biomater. Esthet. (Online) [online]. 2010, vol.5, n.3, pp. 75-78. ISSN 1984-5960.

The success and durability of dental implants are observed in the most part of treatments to replace missing teeth, however, some failures of them, described in the literature, can compromise the patient's rehabilitation. A 46-years-old patient was rehabilitated with a Brånemark classical prosthesis. However one implant in the anterior region of the mandible, that sustained the prosthesis, after 18 months of the installation showed mobility, pain and exsudation, being necessary to retrieve it. The osseointegration process is established between bone tissue and oxides formed on surface of commercially pure titanium, used in the manufacture of the dental implants. However, contaminants agents can be released from superficial layer of dental implants, potencialize inflammatory response and modify the healing process, causing dental implant loss. Aiming to evaluate the presence of possible contaminants in the surface of the lost dental implant, it was sent to CCDM for analysis by using scanning electron microscopy and energy-dispersive spectrometer X-ray (SEM/EDS). It was verified the presence of elements, as C, P, Ca, Na, Cl, Si. These elements can be originated from body fluids or final stages of manufacture, not being possible, for the used techniques to conclude their origin.

Palavras-chave : Dental implants; X-rays; Microscopy, electron, scanning.